Our main equipments :
- Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
- X-ray photoelectron Spectroscopy (XPS)
- Atomic force microscopy (AFM)
- Scanning Electron Microscopy/Energy Dispersive Spectroscopy (SEM-EDS)
- Fourier Transform Infrared Spectroscopy (FTIR)
- wettability
- tensiometry
- RF & MW plasma
- (V)UV sources
- soft lithography
- electroless metallization